FEI Nova 200 dual beam scanning electron microscope / focused ion beam (SEM/FIB) FEGSEM
with EDS, EBSD and Omniprobe AutoProbe.
Thermo Electron Nicolet 6700 Fourier transform infrared (FTIR) spectrometer.
FEI Tecnai F20 analytical high resolution transmission electron microscope (AHRTEM)
with Super-Twin Lens, EDS, PEELS, HAADF.
Rigaku Ultima III x-ray diffractometer (XRD) with thin film, grazing incidence, in-plane
diffraction, Small angle x-ray scattering (SAXS) with evacuated beam path, 1500°C
hot stage with controlled atmosphere (vacuum, inert), pole figure software for texture
analysis